The results and procedure of the alignment of the MINOS Far Detector are presented. The far detector has independent alignments of SM1 and SM2. The misalignments have an estimated uncertainty of ~ 850 micron for SM1 and ~ 750 micron µm for SM2. The alignment has as inputs the average rotations of U and V as determined by optical survey and strip positions within modules measured from the module mapper. The output of this is a module-module correction for transverse mis-alignments. These results were verified by examining an independent set of data.
These alignment constants on average contribute much less then 1 % to the total uncertainty in the transverse strip position.
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Posted by David Boehnlein