MINOS Document 1017-v1

Choice of the readout system threshold for light-tightness measurements of Near Detector modules in New Muon Lab

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John Urish
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John Urish
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02 Apr 2004, 12:00
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02 Apr 2004, 12:00
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02 Apr 2004, 12:00
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08 Sep 2006, 21:17
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Choice of the Readout System Threshold for Light-Tightness Measurements of the Near Detector Modules in New Muon Lab *)
V. Semenov (IHEP), A. Terekhov (Lebedev Inst.) and I. Trostin (ITEP)
*) Presented at MINOS Collaborating Meeting, FNAL, March 25, 2004.
A simple procedure of choosing the readout system threshold in a number of photoelectrons was tested for measurements of the light-tightness in the Near Detector scintillator modules. The most important measurement conditions are described. The absence of light leakage in 5 modules in the nine planes of the Near Detector prototype in the New Muon Laboratory is shown with an accuracy ~ 1 % and with a threshold value ~ 0.1 photoelectron. A preliminary analysis of the main components of the singles rates in the scintillator modules is reported.

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V.Semenov (IHEP), A.Terekhov (Lebedev Inst.) and I.Trostin (ITEP)
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In this note the simple procedure of choosing the readout system threshold (in phe) was tested for correct measuring of light-tightness in Near Detector modules, fiber cables and optical connectors. The most important measurement conditions are described.
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